Design and Implementation of Jtag Compatible 4-Bit Multiplier
A.Indira, B.Sumathi1, S.Vigneshwari2, A.Saravanaselvan3
1A.Indria,in ECE department, National Engineering College ,kovilpatti, thoothukudi, Tamilnadu, India.
2B.Sumathi in ECE department, National Engineering College ,kovilpatti, thoothukudi, Tamilnadu, India.
3S.Vigneshwari in ECE department, National Engineering College ,kovilpatti, thoothukudi, Tamilnadu ,India.
4A.Saravanaselven department, National Engineering College ,kovilpatti, thoothukudi, Tamilnadu ,India.
Manuscript received on April 02, 2020. | Revised Manuscript received on April 21, 2020. | Manuscript published on May 30, 2020. | PP: 1317-1320 | Volume-9 Issue-1, May 2020. | Retrieval Number: F8830038620/2020©BEIESP | DOI: 10.35940/ijrte.F8830.059120
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: The novel scan- based methodology was developed and resulted in system designers agreeing on it due to the rising complication of boards and also enhancement of technologies like multichip modules. It is called as boundary scan testing for the board level chips. This method was established by the Joint Test Access Group. It was named as JTAG. JTAG was developed for verifying designs and testing printed circuit boards after manufacture. A JTAG interface is a special interface added to a chip. Traditional test technologies require very large and expensive equipment. The most aim of this paper is to style and implement 4-bit multiplier using this standard. The designs were being verified and the circuit boards were being tested after the manufacture by using the industry standard JTAG. It is employed because of accessing sub-blocks of chips. It’s a very important mechanism for debugging embedded systems. Boundary-scan cells created exploitation electronic device and latch circuits square measure hooked up to each pin on the device. These cells, embedded among the device, will capture knowledge from pin or core logic signals conjointly as force knowledge onto pins. Captured knowledge is serially shifted out through the JTAG take a look at Access Port (TAP) and will be compared to expected values to figure out a pass or fail result. Forced take a look at knowledge is serially shifted into the boundary-scan cells.
Keywords: Boundary scan testing, JTAG, JTAG interface, 4 bit multiplier.
Scope of the Article: Design and Diagnosis