Design of a Dual Doping Less Double Gate Tfet and Its Material Optimization Analysis on a 6t Sram Cells
K. Niranjan Reddy1, PVY Jayasree2
1K. Niranjan Reddy, Assoc. Professor in CMR Institute of Technology, Hyderabad & Research Scholar in GITAM University Visakhapatnam, India
2PVY Jayasree, Professor & HOD, GITAM Institute of Technology, GITAM University, Visakhapatnam, India
Manuscript received on 16 April 2019 | Revised Manuscript received on 21 May 2019 | Manuscript published on 30 May 2019 | PP: 539-546 | Volume-8 Issue-1, May 2019 | Retrieval Number: F2545037619 /19©BEIESP
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Deliberate advancement in the improvement of a Tunnel Field Effect transistor as an appropriate option in contrast to ordinary Metal Oxide Semiconductor Field Effect Transistor (MOSFET)for accomplishing unrivaled current execution, However, these TFET’s likewise have a disadvantage of spillage current, sub edge swing and besides the effect of arbitrary doping vacillations causing huge execution debasement at low power supply. In this work, tunneling gate length, the spillage current, and sub threshold swing are taken as measurements for dissecting a Dual Material (DM) Doping less Double Gate Tunneling Field Effect Transistor (DL-DGTFET) utilizing 6T SRAM cells. The DLTFET is a transistor which utilizes the idea of tunneling, by narrowing the boundary among source and channel of the gadget, to kill the gadget ON and. It isn’t constrained by traditional warm tail and shows a vital exhibition at low power and abatement spillage current and power dispersal. So additionally, usage of doping less gadget has a genuine ideal advantage in the field of building and has pulled in consideration because of their rearranged assembling process. The recreation results delineates, the spillage current, Ion and I off proportion and sub limit swing varieties are examined with the proposed procedure. It demonstrates critical improvement contrasted with regular field impact transistor.
Keywords: Doping Less DGTFET, Dual Material (DM), HSPICE Tool, ON/OFF, Sub Threshold Swing, 6T SRAM
Scope of the Article: Discrete Optimization