Structural Analysis of SnO2 Thin Films at Various Temperatures (313, 333, 353 and 373 K)
K. Gurushankar1, M. Gohul Kumar2, K. Viswanathan3, M. S. Revathy4, S. Jeyavijayan5
1K. Gurushankar, Department of Physics, Kalasalingam Academy of Research and Education College, Krishnankoil (Tamil Nadu), India.
2M. Gohulkumar, Department of Physics, Vivekanandha Vivekanandha College of Arts and Science, Tiruchengode (Tamil Nadu), India.
3K. Viswanathan, Department of Physics, Kalasalingam Academy of Research and Education College, Krishnankoil (Tamil Nadu), India.
4M. S. Revathy, Department of Physics, Kalasalingam Academy of Research and Education College, Krishnankoil (Tamil Nadu), India.
5S. Jeyavijayan, Department of Physics, Kalasalingam Academy of Research and Education College, Krishnankoil (Tamil Nadu), India.
Manuscript received on 03 December 2019 | Revised Manuscript received on 21 December 2019 | Manuscript Published on 31 December 2019 | PP: 914-916 | Volume-8 Issue-4S2 December 2019 | Retrieval Number: D11731284S219/2019©BEIESP | DOI: 10.35940/ijrte.D1173.1284S219
Open Access | Editorial and Publishing Policies | Cite | Mendeley | Indexing and Abstracting
© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: The present paper which deals with thin oxide thin films were prepared by dip coating technique at different bath temperatures (313, 333, 353 and 373 K) and annealed at 400°C and then subjected to structural study.
Keywords: Sno2 Thin Films, Dip Coating Technique, Annealing, Structural Study.
Scope of the Article: Structural Engineering