Identification of Plant Leaf Disease using Machine Learning Techniques
Shabari Shedthi B1, M Siddappa2, Surendra Shetty3
1Correspondence Author Shabari Shedthi B*, CSE,, NMAM Institute of Technology, Nitte,(affiliated to VTU, Belagavi), India.
2M siddappa, CSE, SSIT, Tumkur, India.
3Surendra Shetty, MCA,, NMAM Institute of Technology, Nitte, (affiliated to VTU, Belagavi), India.
Manuscript received on 01 August 2019. | Revised Manuscript received on 09 August 2019. | Manuscript published on 30 September 2019. | PP: 6077-6081 | Volume-8 Issue-3 September 2019 | Retrieval Number: C5621098319/2019©BEIESP | DOI: 10.35940/ijrte.C5621.098319
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: Plant disease identification and classification is major area of research as majority of people in India depend on agriculture for their main source of income and for food. Identification of the diseases in any crops is challenging since manual identification techniques being used in this are based on the experts advises which may not be efficient. Based on leaf features decisions about variety of diseases are taken. In this paper an automated framework is introduced which can be used to detect and classify the diseases in the leaf accurately. Leaf images are acquired by using digital camera. Pre-processing techniques, segmentation and feature extraction are performed on the acquired images. The features are passed on to the classifiers to classify the diseases. This work has been proposed to classify and distinguish the leaf sample based on its features. The proposed work is carried out with Artificial Neural Network (ANN), Support Vector Machine (SVM) and Naive Bayes classifiers to analyze the result. For given dataset ANN performed better than the other two classifiers.
Keywords: Disease Identification; Artificial Neural Network; Support Vector Machine; Naive Bayes.
Scope of the Article: Machine Learning