Failure Analysis Methods for Reliability Improvement of Electronic Sensors
Swajeeth Pilot. Panchangam1, V. N. A. Naikan2
1Swajeeth Pilot. Panchangam, Department of Reliability Engineering Centre, Indian Institute of Technology, Kharagpur (West Bengal), India.
2V. N. A. Naikan, Department of Reliability Engineering Centre, Indian Institute of Technology, Kharagpur (West Bengal), India.
Manuscript received on 18 August 2012 | Revised Manuscript received on 25 August 2012 | Manuscript published on 30 August 2012 | PP: 83-87 | Volume-1 Issue-3, August 2012 | Retrieval Number: C0266071312/2012©BEIESP
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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: This paper has documented the common failure modes of electronic sensors. The effects of failure modes are studied in detail and these are classified based on their criticality and probability of occurrence. Methods for taking corrective actions for eliminating the occurrence of various failure modes are also proposed. The paper also addresses FRACAS method and its effectiveness for reliability studies of sensors based on the real failure modes observed in practice. It is understood that the designer has an important role in elimination of the failure modes at the design stage itself. This is expected to result in reliability growth of sensor systems used in many critical systems such as space applications, nuclear power plants, and chemical industries etc.
Keywords: Sensor Reliability, FMEA, FRACAS, Reliability Growth Analysis, Sensor Failure Modes.
Scope of the Article: Reliability, Scalability