An Improved Integrated Energy and Trust-based Routing Mechanism for MANETs
V. Vijayagopal1, K. Prabu2

1V.Vijayagopal, Research Scholar, PG & Research Department of Computer Science, Sudharsan College of Arts & Science, Pudukkottai – 622104, (Tamil Nadu), India.
2Dr. K.Prabu, Associate Professor, PG & Research Department of Computer Science, Sudharsan College of Arts & Science, Pudukkottai – 622104, (Tamil Nadu), India. 

Manuscript received on 01 August 2019. | Revised Manuscript received on 06 August 2019. | Manuscript published on 30 September 2019. | PP: 8914-8919 | Volume-8 Issue-3 September 2019 | Retrieval Number: C3884098319/2019©BEIESP | DOI: 10.35940/ijrte.C3884.098319

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© The Authors. Blue Eyes Intelligence Engineering and Sciences Publication (BEIESP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)

Abstract: The degree of packet dissemination among the mobile nodes of the network depends on the reliability of each individual mobile node attributed towards the benefits of the other interacting nodes in forwarding activity. However, the selfish intent of selfish nodes in the network reduces the performance in terms of packet forwarding rate. Thus, the influence of selfish intent in the network need to be minimized to the maximum level by introducing a predominant isolation process. In this paper, a Gwet Kappa Reliability Factor-based Selfish Node Detection Technique (GKRF-SNDT) scheme is proposed for superior detection of selfish nodes in the network. This proposed GKRF-SNDT scheme inherently derives the advantages of Gwet Kappa Reliability Factor for quantifying the degree of trust possessed by each mobile nodes interacting in the network. The experimental investigations of the proposed GKRF-SNDT scheme confirmed a superior throughput rate of 18% with reduced energy consumptions of 21% compared to the existing selfish intent isolation approaches.
Index Terms: Gwet Reliability Factor, Selfish Nodes, Mobile Nodes, Data Dissemination.

Scope of the Article:
Nanometer-Scale Integrated Circuits